Arnon Max Hurwitz grew up in Cape Town,
South Africa and came to the USA in 1979 as a student of Economics at
Carnegie-Mellon University. He has a PhD in Mathematical Statistics. He began
writing fiction and non-fiction in 1980, and has published in The Greensboro
Review (1982), and Big Sky Journal (2005, 2008). Arnon published a book and CD
of alphabet poems – ‘Alphabet-Saurus!’
– in 2015, a collection of stories set in South Africa – ‘Roads to Barnato’ – in 2018, and second collection of short
stories—‘Lost In The Woods’— in 2020.
He has lived in Pennsylvania, North Carolina, Texas, Montana, California – and now
lives in Havre de Grace, Maryland with his wife Mary Frances, writes, and plays
the fiddle. He has three children and three grandchildren.
by James Moyne (Editor), Enrique del Castillo (Editor), Arnon M. Hurwitz (Editor)
Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine “runs,” thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry’s widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-depth analyses of R2R control.
